[D-2-4] Characterization of Residual Stress in Semi-Insulating GaAs:Cr by Photoluminescence Method

Y. FUJIWARA, A. KOJIMA, T. NISHINO, Y. HAMAKAWA, K. YASUTAKA, M. UMENO, H. KAWABE (1.Department of Electrical Engineering, Faculty of Engineering Science, Osaka University, 2.Department of Precision Engineering, Faculty of Engineering, Osaka University)

https://doi.org/10.7567/SSDM.1984.D-2-4