[D-2-5] C-V Profiling Studies on MBE-Grown GaAs/AlGaAs Heterojunction Interface

Miyoko O. Watanabe, Jiro Yoshida, Masao Mashita, Takatosi Nakanisi, Akimichi Hojo (1.Toshiba Research and Development Center)

https://doi.org/10.7567/SSDM.1984.D-2-5