[LD-1-5] Structural Characterization of Very Thin Films by Fluorescence-Detected X-Ray Absorption Spectroscopy

H. Oyanagi、H. Tanoue、T. Ishiguro、T. Matsushita、K. Kohra (1.Electrotechnical Laboratory、2.Photon Factory, National Laboratory for High Energy Physics)

https://doi.org/10.7567/SSDM.1984.LD-1-5