[B-2-3] Interface Stress at InGaPAs/GaAs Heterojunction

Sho SHIRAKATA, Yasufumi FUJIWARA, Masahiko KONDO, Taneo NISHINO, Yoshihiro HAMAKAWA (1.Department of Electrical Engineering, Faculty of Engineering Science, Osaka University)

https://doi.org/10.7567/SSDM.1985.B-2-3