[A-8-3] Correlation of Carrier Trapping and Oxide Breakdown with H2O Partial Pressures in Pyrogenic Oxides

A. S. Vengurlekar, V. Lakshmanna, K. V. Ramanathan (1.Tata Institute of Fundamental Research)

https://doi.org/10.7567/SSDM.1986.A-8-3