[A-9-2] Effects of X-Ray Irradiation on the Channel Hot-Carrier Reliability of Thin-Oxide n-Channel MOSFETs

J. Y. #NAME?、J. R. Maldonado、M. D. Rodriguez、J. Laskar、D. S. Zicherman (1.IBM T.J. Watson Research Center)

https://doi.org/10.7567/SSDM.1986.A-9-2