[B-7-1] Effective Funneling Length in Alpha-Particle Induced Soft Errors

E. TAKEDA, K. TAKEUCHI, E. YAMASAKI, T. TOYABE, K. OHSHIMA, K. ITOH (1.Central Research Laboratory, Hitachi Ltd., 2.Hitachi VLSI Engineering Corp., 3.Device Development Center, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1986.B-7-1