Sub-Picosecond Electrical Signals for Probing VLSI Environments

M. B. Ketchen; D. R. Grischkowsky; J. -M. Halbout; C. C. Chi; I. N. Duling III; W. J. Gallagher; G. P. Li; P. G. May; M. Scheuermann

doi:https://doi.org/10.7567/SSDM.1986.B-7-6

1986 International Conference on Solid State Devices and Materials

1986年8月20日〜 1986年8月22日
Tokyo Prince Hotel, Tokyo, Japan

[B-7-6] Sub-Picosecond Electrical Signals for Probing VLSI Environments

M. B. Ketchen、D. R. Grischkowsky、J. -M. Halbout、C. C. Chi、I. N. Duling III、W. J. Gallagher、G. P. Li、P. G. May、M. Scheuermann (1.IBM Thomas J. Watson Research Center)

https://doi.org/10.7567/SSDM.1986.B-7-6

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