[C-3-5] Disorder Induced Gap State Model for Anomalous C-V Carrier Concentration Profiles at Epitaxially Grown Interfaces

Hideki Hasegawa, Eiji Ikeda, Hideo Ohno (1.Department of Electrical Engineering, Faculty of Engineering Hokkaido University)

https://doi.org/10.7567/SSDM.1986.C-3-5