[C-9-1] Structural Characterization of Ga0.47In0.53As/Al0.48In0.52As Superlattices Grown by Molecular Beam Epitaxy

L. Tapfer, W. Stolz, K. Ploog (1.Max-Planck-Institut fur Festkorperforschung, 2.NTT Research Laboratories)

https://doi.org/10.7567/SSDM.1986.C-9-1