[C-9-1] Structural Characterization of Ga0.47In0.53As/Al0.48In0.52As Superlattices Grown by Molecular Beam Epitaxy
L. Tapfer、W. Stolz、K. Ploog
(1.Max-Planck-Institut fur Festkorperforschung、2.NTT Research Laboratories)
https://doi.org/10.7567/SSDM.1986.C-9-1