[D-4-4] Scanning AES Studies of Electromigration of Ag, In and Sb Ultrathin Films on Si

Hitoshi Yasunaga, Shigetoshi Sakomura, Shiro Kobayashi, Naoki Okuyama, Akiko Natori (1.The University of Electro-Communications, Department of Electronic Engineering)

https://doi.org/10.7567/SSDM.1986.D-4-4