[C-1-1] The Characterization of P-MOS FET Fabricated on SOI with Controlled Crystal Orientation

K. Shirakawa、M. Maekawa、O. Yamazaki、H. Tsuji、M. Koba (1.Central Research Laboratories, SHARP Corporation)

https://doi.org/10.7567/SSDM.1987.C-1-1