[C-1-1] The Characterization of P-MOS FET Fabricated on SOI with Controlled Crystal Orientation

K. Shirakawa, M. Maekawa, O. Yamazaki, H. Tsuji, M. Koba (1.Central Research Laboratories, SHARP Corporation)

https://doi.org/10.7567/SSDM.1987.C-1-1