[S-III-2] Interfacial Super Structure between Epitaxial Si(111) Layers and B(√3 x √3)/Si(111) Substrates Studied by Synchrotron X-Ray Diffraction
K. Akimoto, J. Mizuki, I. Hirosawa, T. Tatsumi, H. Hirayama, N. Aizaki, J. Matsui
(1.Fundamental Research Laboratories, NEC Corporation)
https://doi.org/10.7567/SSDM.1987.S-III-2