[C-5-8] Measurement of the Surface Recombination Velocity S at the Si-SiO2 Interface by the Dual-Mercury Probe Method

Eiichi Suzuki, Hidetaka Takato, Kenichi Ishii, Yutaka Hayashi (1.Electrotechnical Laboratory)

https://doi.org/10.7567/SSDM.1990.C-5-8