[C-5-8] Measurement of the Surface Recombination Velocity S at the Si-SiO2 Interface by the Dual-Mercury Probe Method Eiichi Suzuki、Hidetaka Takato、Kenichi Ishii、Yutaka Hayashi (1.Electrotechnical Laboratory) https://doi.org/10.7567/SSDM.1990.C-5-8
