[S-E-26] Degradation of Sub-Threshold Characteristics in a-Si TFT with Polyimide Passivation

Tetsu OGAWA, Hirofumi WAKEMOTO, Hiroyoshi TAKEZAWA, Sadayoshi HOTTA (1.Display Technology Research Laboratory, Matsushita Electric Industrial Co., Ltd., 2.Ishikawa-plant, Liquid Crystal Display SUM, Matsushita Electric Industrial Co., Ltd.)

https://doi.org/10.7567/SSDM.1990.S-E-26