A Simple Model for the Switching Behavior of a SONOS EEPROM Device

J. K. Lin; C. Y. Chang; T. S. Ho; H. S. Huang

doi:https://doi.org/10.7567/SSDM.1992.PA2-3

1992 International Conference on Solid State Devices and Materials

1992年8月26日〜 1992年8月28日
Tsukuba Center Building, Tsukuba, Japan

[PA2-3] A Simple Model for the Switching Behavior of a SONOS EEPROM Device

J. K. Lin、C. Y. Chang、T. S. Ho、H. S. Huang (1.Institute of Electronics, National Chiao Tung University、2.Memory Products Division, United Microelectronics Corporation)

https://doi.org/10.7567/SSDM.1992.PA2-3

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