[S-II-4] X-Ray Standing Wave Analysis of GaAs/Si Interface

Tomoaki Kawamura、Hisataka Takenaka、Makoto Uneta、Masaharu Oshima、Yukio Fukuda、Yoshiro Ohmachi、Koichi Izumi、Tetsuya Ishikawa、Seishi Kikuta、Xiao Wei Zhang (1.NTT Interdisciplinary Research Laboratories、2.NTT Optoelectronics Laboratories、3.Faculty of Engineering, The University of Tokyo、4.Photon Factory, National Laboratory for High Energy Physics)

https://doi.org/10.7567/SSDM.1992.S-II-4