The Japan Society of Applied Physics

[S-V-9] Schottky Barrier Heights of Atomically-Controlled Silicide/Silicon Interfaces

R. T. Tung, J. P. Sullivan, F. Schrey (1.AT&T Bell Laboratories, 2.Department of Materials Science and Engineering, University of Pennsylvania)

https://doi.org/10.7567/SSDM.1992.S-V-9