[A-3-4] Investigations on Hole Trapping and Detrapping Phenomena in Thin Oxide Films

Quazi Deen Mohd Khosru, Naoki Yasuda, Kenji Taniguchi, Chihiro Hamaguchi (1.Department of Electronic Engineering, Osaka University, 2.Toshiba Corporation, ULSI Research Center)

https://doi.org/10.7567/SSDM.1993.A-3-4