The Japan Society of Applied Physics

[A-4-4] Identification of Generation-Recombination Centers and Traps among Interface States by Cryogenic Charge Pumping Technique

Jen-Tai Hsu, C. R. Viswanathan (1.Department of Electrical Engineering, University of California)

https://doi.org/10.7567/SSDM.1993.A-4-4