[D-2-3] Threading Dislocations in GaAs on Pre-Patterned Si and in Post-Patterned GaAs on Si
M. Tamura, T. Saitoh, J. Palmer, T. Yodo, J. Kasai, A. Nishida
(1.Optoelectronics Technology Research Laboratory, 2.Central Research Laboratory, Hitachi, Ltd.)
https://doi.org/10.7567/SSDM.1993.D-2-3