Measurements on a High-Tc RSFQ Circuit at 4.2K

Z. G. Ivanov; V. K. Kaplunenko; E. A. Stepantsov; E. Wikborg; T. Claeson

doi:https://doi.org/10.7567/SSDM.1993.LC-16

[LC-16] Measurements on a High-Tc RSFQ Circuit at 4.2K

Z. G. Ivanov、V. K. Kaplunenko、E. A. Stepantsov、E. Wikborg、T. Claeson (1.Department of Physics, Chalmers University of Technology、2.Institute of Radioelectronics and Engineering、3.Institute of Crystallography、4.Ericsson Telecom)

https://doi.org/10.7567/SSDM.1993.LC-16

1993 International Conference on Solid State Devices and Materials

[LC-16] Measurements on a High-Tc RSFQ Circuit at 4.2K