Measurements on a High-Tc RSFQ Circuit at 4.2K

Z. G. Ivanov; V. K. Kaplunenko; E. A. Stepantsov; E. Wikborg; T. Claeson

doi:https://doi.org/10.7567/SSDM.1993.LC-16

[LC-16] Measurements on a High-Tc RSFQ Circuit at 4.2K

Z. G. Ivanov, V. K. Kaplunenko, E. A. Stepantsov, E. Wikborg, T. Claeson (1.Department of Physics, Chalmers University of Technology, 2.Institute of Radioelectronics and Engineering, 3.Institute of Crystallography, 4.Ericsson Telecom)

https://doi.org/10.7567/SSDM.1993.LC-16

1993 International Conference on Solid State Devices and Materials

[LC-16] Measurements on a High-Tc RSFQ Circuit at 4.2K