[PB-3-7] Modeling of the Hole Current Caused by Fowler-Nordheim Tunneling through Thin Oxides

Gertjan Hemink, Tetsuo Endoh, Riichiro Shirota (1.Toshiba Research and Development Center ULSI Research Laboratories)

https://doi.org/10.7567/SSDM.1993.PB-3-7