[PC-1-23] Effect of Radical Oxygen for Epitaxial Growth of Al2O3 on Si
Kiyoteru Hayama、Makoto Ishida、Tetsuro Nakamura
(1.Technology Development Center, Department of Electric & Electronic Engineering, Toyohashi University of Technology)
https://doi.org/10.7567/SSDM.1993.PC-1-23