[PC-2-6] Time Evolution of Electrostatic Force Induced by Contact-Electrified Charges on Thin Silicon Oxide Surface

Yoshinobu FUKANO、Takayuki UCHIHASHI、Yasuhiro SUGAWARA、Yoshiki YAMANISHI、Takahiko OASA、Seizo MORITA (1.Department of Physics, Faculty of Science, Hiroshima University、2.Advanced Technology Research Labs., Sumitomo Metal Industries, Ltd.)

https://doi.org/10.7567/SSDM.1993.PC-2-6