Reverse Characteristics Analysis of Defferent AlInAs-Schottky Contacts

H. Hoenow; H.-G. Bach; G. Heymann

doi:https://doi.org/10.7567/SSDM.1993.PD-2-8

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜 1993年9月1日
Makuhari Messe, Chiba, Japan

[PD-2-8] Reverse Characteristics Analysis of Defferent AlInAs-Schottky Contacts

H. Hoenow、H.-G. Bach、G. Heymann (1.Humboldt-Universitat zu Berlin, Inst. fur Werkstoffe und Verfahrenstechnik、2.Heinrich-Hertz-Institut fur Nachrichtentechnik Berlin GmbH)

https://doi.org/10.7567/SSDM.1993.PD-2-8

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