[S-I-7-3] Ge Epitaxial Overlayers on Si(001) Studied by Surface-Sensitive XAFS; Evidence for Strain-induced Surface Site Exchange

Hiroyuki OYANAGI、Kunihiro SAKAMOTO、Ryu SHIODA、Tsunenori SAKAMOTO (1.Electrotechnical Laboratory)

https://doi.org/10.7567/SSDM.1993.S-I-7-3