Resistance Oscillations Induced by a Direct Current Electromigration

K. Fujiki; A. Sano; K. Inoue; H. Sakaue; S. Shigubara; Y. Horiike

doi:https://doi.org/10.7567/SSDM.1994.C-10-2

1994 International Conference on Solid State Devices and Materials

1994年8月23日〜 1994年8月26日
Pacifico Yokohama, Yokohama, Japan

[C-10-2] Resistance Oscillations Induced by a Direct Current Electromigration

K. Fujiki、A. Sano、K. Inoue、H. Sakaue、S. Shigubara、Y. Horiike (1.Hiroshima University, Dept. of Electrical Engineering、2.Toyo University, Dept. of Electrical Engineering)

https://doi.org/10.7567/SSDM.1994.C-10-2

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