Resistance Oscillations Induced by a Direct Current Electromigration

K. Fujiki; A. Sano; K. Inoue; H. Sakaue; S. Shigubara; Y. Horiike

doi:https://doi.org/10.7567/SSDM.1994.C-10-2

1994 International Conference on Solid State Devices and Materials

Aug 23, 1994 - Aug 26, 1994
Pacifico Yokohama, Yokohama, Japan

[C-10-2] Resistance Oscillations Induced by a Direct Current Electromigration

K. Fujiki, A. Sano, K. Inoue, H. Sakaue, S. Shigubara, Y. Horiike (1.Hiroshima University, Dept. of Electrical Engineering, 2.Toyo University, Dept. of Electrical Engineering)

https://doi.org/10.7567/SSDM.1994.C-10-2

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