[B-3-6] Experimental Study of the Soft Breakdown I-V Characteristics in Ultrathin SiO2 Layers

Enrique MIRANDA、Jordi SUNE、Rosana RODRIGUEZ、Montserrat NAFRIA、Ferran MARTIN、Xavier AYMERICH (1.Dept. Enginyeria Electronica, Universitat Autonoma de Barcelona)

https://doi.org/10.7567/SSDM.1998.B-3-6