[C-1-7] Quantum Confinement Effect in Self-Assembled, Nanometer Silicon Dots

S. A. Ding, M. Ikeda, M. Fukuda, S. Miyazaki, M. Hirose (1.Department of Electrical Engineering, Hiroshima University, 2.CREST, Japan Science and Technology Corporation (JST))

https://doi.org/10.7567/SSDM.1998.C-1-7