Scanning Single Electron Transistor Microscopy: Imaging Individual Charges

M. J. Yoo; T. A. Fulton; H. F. Hess; R. L. Willett; L. N. Dunkleberger; R. J. Chichester; L. N. Pfeiffer; K. W. West

doi:https://doi.org/10.7567/SSDM.1998.C-5-1

1998 International Conference on Solid State Devices and Materials

Sep 7, 1998 - Sep 10, 1998
International Conference Center Hiroshima, Hiroshima, Japan

[C-5-1] Scanning Single Electron Transistor Microscopy: Imaging Individual Charges

M. J. Yoo, T. A. Fulton, H. F. Hess, R. L. Willett, L. N. Dunkleberger, R. J. Chichester, L. N. Pfeiffer, K. W. West (1.Lucent Technologies Bell Laboratories)

https://doi.org/10.7567/SSDM.1998.C-5-1

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