Merits and Demerits of Single Electron Effects in Ultra-Small Semiconductor Devices

Akiko Ohata; Akira Toriumi

doi:https://doi.org/10.7567/SSDM.1998.C-5-7

1998 International Conference on Solid State Devices and Materials

1998年9月7日〜 1998年9月10日
International Conference Center Hiroshima, Hiroshima, Japan

[C-5-7] Merits and Demerits of Single Electron Effects in Ultra-Small Semiconductor Devices

Akiko Ohata、Akira Toriumi (1.Frontier Research Program, The Institute of Physical and Chemical Research、2.Advanced Semiconductor Device Research Laboratories, Toshiba Corporation)

https://doi.org/10.7567/SSDM.1998.C-5-7

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