Growth of Wide Gap II-VI Materials, Its Characterization and Device Application

Detlef Hommel; Helmut Wenisch; Martin Behringer; Michael Fehrer; Matthias Klude; Andreas Isemann; Kazuhiro Ohkawa

doi:https://doi.org/10.7567/SSDM.1998.C-7-1

1998 International Conference on Solid State Devices and Materials

1998年9月7日〜 1998年9月10日
International Conference Center Hiroshima, Hiroshima, Japan

[C-7-1] Growth of Wide Gap II-VI Materials, Its Characterization and Device Application

Detlef Hommel、Helmut Wenisch、Martin Behringer、Michael Fehrer、Matthias Klude、Andreas Isemann、Kazuhiro Ohkawa (1.Institute of Solid State Physics, University of Bremen、2.Department of Applied Physics, Science University of Tokyo)

https://doi.org/10.7567/SSDM.1998.C-7-1

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