[C-9-8] Electrical Stabilization of Diamond MIS Interface by Employing BaF2 Insulator Film and Application to Diamond MISFETs

Hiroyuki Tanaka, Akihiro Ito, Young Yun, Tetsuro Maki, Takeshi Kobayashi (1.Graduate School of Engineering Science, Osaka University)

https://doi.org/10.7567/SSDM.1998.C-9-8