[C-9-8] Electrical Stabilization of Diamond MIS Interface by Employing BaF2 Insulator Film and Application to Diamond MISFETs

Hiroyuki Tanaka、Akihiro Ito、Young Yun、Tetsuro Maki、Takeshi Kobayashi (1.Graduate School of Engineering Science, Osaka University)

https://doi.org/10.7567/SSDM.1998.C-9-8