[A-1-2] Leakage Mechanism of Local Junctions Forming Main or Tail Mode of DRAM Retention Characteristics

Shuichi Ueno, Yasuo Inoue, Masahide Inuishi (1.ULSI development center, MITSUBISHI electric corporation)

https://doi.org/10.7567/SSDM.1999.A-1-2