Anomalous Leakage Current Model for Retention Failure in Flash Memories

Yutaka Okuyama; Takashi Kobayashi; Hitoshi Kume; Shiro Kamohara; Yukiko Manabe; Masataka Kato; Kousuke Okuyama; Katsuhiko Kubota

doi:https://doi.org/10.7567/SSDM.1999.C-12-2

[C-12-2] Anomalous Leakage Current Model for Retention Failure in Flash Memories

Yutaka Okuyama, Takashi Kobayashi, Hitoshi Kume, Shiro Kamohara, Yukiko Manabe, Masataka Kato, Kousuke Okuyama, Katsuhiko Kubota (1.Central Research Laboratory, Hitachi, Ltd., 2.Semiconductor & Integrated Circuits, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1999.C-12-2

1999 International Conference on Solid State Devices and Materials

[C-12-2] Anomalous Leakage Current Model for Retention Failure in Flash Memories