Anomalous Leakage Current Model for Retention Failure in Flash Memories

Yutaka Okuyama; Takashi Kobayashi; Hitoshi Kume; Shiro Kamohara; Yukiko Manabe; Masataka Kato; Kousuke Okuyama; Katsuhiko Kubota

doi:https://doi.org/10.7567/SSDM.1999.C-12-2

[C-12-2] Anomalous Leakage Current Model for Retention Failure in Flash Memories

Yutaka Okuyama、Takashi Kobayashi、Hitoshi Kume、Shiro Kamohara、Yukiko Manabe、Masataka Kato、Kousuke Okuyama、Katsuhiko Kubota (1.Central Research Laboratory, Hitachi, Ltd.、2.Semiconductor & Integrated Circuits, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1999.C-12-2

1999 International Conference on Solid State Devices and Materials

[C-12-2] Anomalous Leakage Current Model for Retention Failure in Flash Memories