The Japan Society of Applied Physics

[C-3-2] Spatially Resolved Imaging of the Spectral Emission Characteristic of InGaN-MQW-LEDs by Scanning Electroluminescence Microscopy

Peter Fischer, Jurgen Christen, Margit Zacharias Veit Schwegler, Christoph Kirchner, Markus Kamp (1.Institute of Experimental Physics, Otto-von-Guericke University, 2.Department of Optoelectronics, University of Ulm)

https://doi.org/10.7567/SSDM.1999.C-3-2