[D-2-2] Experimental Analysis of Carrier Charging Characteristics in Si Nanocrystal Floating Gate Memory

Ryuji Ohba, Naoharu Sugiyama, Junji Koga, Ken Uchida, Akira Toriumi (1.Advanced LSI Technology Laboratory, TOSHIBA Corporation)

https://doi.org/10.7567/SSDM.1999.D-2-2