[D-2-3] Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique

Naoji Shimizu, Mitsuhisa Ikeda, Eiji Yoshida, Seiichi Miyazaki, Masataka Hirose (1.Department of Electrical Engineering, Hiroshima University)

https://doi.org/10.7567/SSDM.1999.D-2-3