[D-5-3] Hot Electron Transport in Si-MOSFETs Toshitsugu Sakamoto, Hisao Kawaura, Takahiro Iizuka, Toshio Baba (1.Fundamental Research Labs., NEC, 2.ULSI Device Development Labs., NEC) https://doi.org/10.7567/SSDM.1999.D-5-3
