Recovery Dynamics Analysis of Saturable Absorber Optical Gates by Optical Sampling

Masayuki Shirane; Yoichi Hashimoto; Hirohito Yamada; Hiroyuki Yokoyama

doi:https://doi.org/10.7567/SSDM.1999.E-6-4

1999 International Conference on Solid State Devices and Materials

Sep 21, 1999 - Sep 24, 1999
Nihon Toshi Center Kaikan, Tokyo, Japan

[E-6-4] Recovery Dynamics Analysis of Saturable Absorber Optical Gates by Optical Sampling

Masayuki Shirane, Yoichi Hashimoto, Hirohito Yamada, Hiroyuki Yokoyama (1.Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation)

https://doi.org/10.7567/SSDM.1999.E-6-4

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