[A-1-2] New Mechanisms and the Characterization of Plasma Charging Enhanced Hot Carrier Effect in Deep-Submicron N-MOSFET's

S. J. Chen, H. L. Kao, Steve S. Chung, C. C. Chen, C. Y. Chang, H. C. Lin (1.Department of Electronic Engineering, National Chiao Tung University, 2.National Nano Device Lab.)

https://doi.org/10.7567/SSDM.2000.A-1-2