[B-3-5] Statistical Threshold Fluctuations in Si-MOSFETs: Jellium vs. Atomistic Dopant Variations

Nobuyuki Sano、Masaaki Tomizawa、Kenji Natori (1.Institute of Applied Physics, University of Tsukuba、2.NTT Lifestyle and Environmental Technology Labs)

https://doi.org/10.7567/SSDM.2000.B-3-5